John McMaster

@johndmcmaster

IC reverse engineering, , nuclear technology, etc

Vrijeme pridruživanja: kolovoz 2015.

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  1. Prikvačeni tweet
    2. velj

    Hi my name is John and its been two hours since my last microscope purchase

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  2. proslijedio/la je Tweet
    2. velj
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  3. proslijedio/la je Tweet
    31. sij
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  4. proslijedio/la je Tweet
    30. sij

    And now, some microphotography, because of reasons: Best photo of microcircuits I have taken so far. Pretty!

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  5. 30. sij
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  6. 30. sij

    Images were collected using a MagicWand hand scanner on a 1 meter linear stage. However, severe MagicWand artifacts, the worst of which I've corrected, make stitching difficult. I have better camera equipment now and might retry w/ DSLR

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  7. 30. sij

    With 200x scale, width of actual die should be roughly 42 in * 25.4 mm / in / 200 = 5.3 mm

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  8. 30. sij
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  9. 30. sij

    enblend: info: writing final output enblend: error: Maximum TIFF file size exceeded

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  10. 30. sij

    I've split my microscope image stitching tools into their repo to help clean then up for more widespread use:

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  11. 30. sij
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  12. 30. sij

    Stitching 42503 width X 45528 height => 1935 MP. From deep backlog...here's a teaser!

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  13. proslijedio/la je Tweet
    29. sij
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  14. 27. sij

    'splode. Fireball was impressive though!

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  15. 27. sij

    Repairing surplus fiber illuminator: transformer noisy when not at max power. Is this normal...?

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  16. 27. sij

    Repairing surplus fiber illuminator: main issue was front bolts were loose. Easily tightened after some disassembly!

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  17. proslijedio/la je Tweet
    25. sij

    Via Kelly — she always has something to share I haven’t heard about before. :D

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  18. proslijedio/la je Tweet
    25. sij

    Starting a LN2 transfer be like let me play you the song of my people. *Volume up*

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  19. proslijedio/la je Tweet
    23. sij
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  20. proslijedio/la je Tweet
    10. sij

    Unusual Dallas Semiconductor wafer is entirely test circuitry, with 20 test blocks repeated over the wafer. Everything from transistors of different sizes to flash memory cells. Not shown: resistors of many types, anti-fuses, capacitors, isolation, and other chip structures.

    Microscope photo of silicon die showing complex test circuitry.
    A silicon wafer.
    Test circuitry on the die with transistors of various sizes. Labeled "30V PCH". Multiple pads for source, gate, and drain.
    Test circuitry labeled "Flash Memory". One test cell with "1.5 um rules", one with "1.2 um rules".
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